Useful Snapshot: Increasingly complex high-speed IC chips operating at very high frequency demand state-of-the-art RF characterization.

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Supporting Gallery

Automated On Wafer Transistor Pulsed IV measurements
PACT#13 - 1000A class on-wafer measurement with 100μs pulse width
On-wafer Measurement of MoS2 Transistor (Open & short-circuit)
PACT#15 - Fully automated on-wafer power MOSFET test
AU-5 Pulsed IV - AURIGA
Keysight WaferPro Express
On wafer device characterization | Philips Engineering Solutions
PACT#12 - Fully Automated Power Device On-wafer Measurement (Ultra High Current up to 1000A)
IVCAD - Pulsed IV measurements
Pre-RF Pulsed IV Measurements for Enhanced Transistor Compact Modeling
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Read Next
Automated On Wafer Transistor Pulsed IV measurements

Automated On Wafer Transistor Pulsed IV measurements

Read more details and related context about Automated On Wafer Transistor Pulsed IV measurements.

PACT#13 - 1000A class on-wafer measurement with 100μs pulse width

PACT#13 - 1000A class on-wafer measurement with 100μs pulse width

Read more details and related context about PACT#13 - 1000A class on-wafer measurement with 100μs pulse width.

On-wafer Measurement of MoS2 Transistor (Open & short-circuit)

On-wafer Measurement of MoS2 Transistor (Open & short-circuit)

Read more details and related context about On-wafer Measurement of MoS2 Transistor (Open & short-circuit).

PACT#15 - Fully automated on-wafer power MOSFET test

PACT#15 - Fully automated on-wafer power MOSFET test

Read more details and related context about PACT#15 - Fully automated on-wafer power MOSFET test.

AU-5 Pulsed IV - AURIGA

AU-5 Pulsed IV - AURIGA

Read more details and related context about AU-5 Pulsed IV - AURIGA.

Keysight WaferPro Express

Keysight WaferPro Express

Read more details and related context about Keysight WaferPro Express.

On wafer device characterization | Philips Engineering Solutions

On wafer device characterization | Philips Engineering Solutions

Increasingly complex high-speed IC chips operating at very high frequency demand state-of-the-art RF characterization.

PACT#12 - Fully Automated Power Device On-wafer Measurement (Ultra High Current up to 1000A)

PACT#12 - Fully Automated Power Device On-wafer Measurement (Ultra High Current up to 1000A)

Read more details and related context about PACT#12 - Fully Automated Power Device On-wafer Measurement (Ultra High Current up to 1000A).

IVCAD - Pulsed IV measurements

IVCAD - Pulsed IV measurements

Read more details and related context about IVCAD - Pulsed IV measurements.

Pre-RF Pulsed IV Measurements for Enhanced Transistor Compact Modeling

Pre-RF Pulsed IV Measurements for Enhanced Transistor Compact Modeling

Read more details and related context about Pre-RF Pulsed IV Measurements for Enhanced Transistor Compact Modeling.